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Beyond Bandwidth:

The Next Challenge in High-Speed Interconnect Testing

Scalability, channel density and cost-of-test are becoming as important as measurement performance in AI, HPC and optical interconnect validation.

As AI clusters, co-packaged optics, photonic integrated circuits, and next-generation networking ASICs continue to grow in complexity, engineers face a new challenge: scaling signal integrity measurements beyond a handful of channels.

Oscilloscope development focuses primarily on bandwidth, noise floor, and measurement accuracy. Those requirements remain critical, but validation and manufacturing teams increasingly face a different bottleneck: how to characterize dozens, hundreds, or even thousands of high-speed electrical and optical links efficiently.

Advanced switches, GPUs, optical engines, co-packaged optics, transceivers, and silicon photonics devices may contain dozens or hundreds of high-speed lanes operating simultaneously. Every lane must be characterized, validated, and often tested repeatedly throughout development and manufacturing.

Performance (and jitter) still matters

High-speed PAM4 and NRZ signals require precise eye diagram analysis, jitter measurements, transmitter characterization, equalization optimization, and compliance testing. Low-jitter timebase performance remains essential for accurate characterization of today’s optical and electrical communication interfaces.

The challenge is no longer simply achieving accurate measurements, but maintaining the same level of measurement confidence across growing channel counts.

PAM4 eye diagram of  106Gb/s optical data signals in VISEYE software

As channel counts increase, engineers face four key challenges:

Cost of TestLower cost per channel without compromising measurement confidence.
Test ThroughputFaster validation and manufacturing test across more lanes.
Channel DensityMore measurement channels in less rack and lab space.
AutomationSeamless integration into software-driven test environments.

A scalable approach to high-speed interconnect testing

Engineers are increasingly evaluating measurement platforms not only on bandwidth and jitter performance, but also on their ability to scale efficiently from design validation through high-volume manufacturing.

The QCA Series High-Speed Communication Analyzer was developed to address these challenges by combining:

  • Precision low-jitter measurements
  • High channel density and compact footprint
  • Automated system integration
  • Parallel testing capability
  • Strong measurement correlation.

Learn more about the QCA Series oscilloscopes and QCR clock recovery instruments

What capabilities will engineers need from tomorrow’s oscilloscopes?

Whether you’re validating AI interconnects, silicon photonics, co-packaged optics, optical transceivers, or next-generation networking devices, Quantifi Photonics can help you evaluate scalable test strategies that balance performance, throughput, and cost.

Contact our team to discuss your application requirements, measurement challenges, and high-speed I/O test objectives.